系统产品
电子元器件
电子电路设计开发
简体中文
English
器件型号
文档资源
品牌厂家
产品服务
设计支持
联系购买
简体中文
English
首页
>
Avago 安华高
>
无线
>
肖特基
> HSMS-2827
HSMS-2827 RF 混频器/二极管检波器
特点
Specification
Value
Lifecycle
Active
Distrib. Inventory
Yes
Samples Available
No
Configuration
Ring Quad
Ct Pf
1.0
RoHS6 Compliant
Y
Max Qty of Samples
0
Package
SOT-143
Vbr V
15.0
Vf Mv
340.0
Series Res In Ohms
12.0
Application Brief (1)
Surface Mount Schottky PIN Diode
.pdf(08/02/2006)
Application Note (20)
AN 956-5: Dynamic Range Extension Schottky Detectors
.pdf(08/16/2010)
AN 988: All Schottky Diodes are Zero Bias Detectors
.pdf(08/14/2010)
AN 986: Square Law Linear Detection
.pdf(08/14/2010)
AN 963: Matching Techniques for Mixers Detectors
.pdf(08/14/2010)
AN 987: Is Bias Current Necessary
.pdf(08/14/2010)
AN 1187: Design an Input Matching Network for a DC Biased 850 MHz Small Signal Detector
.pdf(08/13/2010)
AN 997: A 2 GHz Balanced Mixer SOT23 Surface Mount Schottky Diodes
.pdf(07/31/2010)
AN 1088: Designing the Virtual Battery
.pdf(07/22/2010)
AN 1124: Linear Models for Diode Surface Mount Packages
.pdf(07/21/2010)
AN 9561: The Criterion for the Tangential Sensitivity Measurement
.pdf(07/19/2010)
AN 5380; Double balanced diode mixer using the HSMS-2822
.pdf(07/16/2010)
AN A004R: Electrostatic Discharge mage Control
.pdf(07/14/2010)
AN 956-3 Flicker Noise Schottky Diodes
.pdf(07/13/2010)
AN 1328: HPMS-2825 A Temperature Compensated Linear Power Detector
.pdf(07/13/2010)
AN 956-6: Temperature Dependence Schottky Detector Voltage Sensitivity
.pdf(06/28/2010)
AN 1069: Non RF Applications for the Surface Mount Schottky Diode Pairs HSMS2802 HSMS2822
.pdf(06/16/2010)
AN 9441: Microwave Transistor Bias Considerations
.pdf(05/11/2010)
AN A006: Mounting Considerations for Microwave Semiconductors
.pdf(07/22/2009)
AN 1156: Diode Detector Simulation EEs ADS Softward
.pdf(02/22/2007)
AN 923: Schottky Barrier Video Detectors
.pdf(12/09/2006)
Data Sheet (1)
HSMS-282x, Surface Mount RF Schottky Barrier Diodes
.pdf(11/28/2014)
Product Change Notice (PCN) (17)
V11-024-480035-0B - Assembly and Test related change
.pdf(05/15/2012)
V11-024-480035-0A - Assembly and Test related change
.pdf(11/04/2011)
Qualifying New Contract Manufacturers
.pdf(03/02/2009)
CCN082701TC1 - Si wafer substrate will change from 3" to 4"
.pdf(10/28/2005)
CCN021402AT1 - Transfer of semiconductor wafer fabrication
.pdf(10/28/2005)
PCN: A03-003-480035-1A, Sept. 2003
.pdf(09/30/2003)
PCN: A03-001-480035-1A, Jan 2003
.pdf(01/07/2003)
Moisture Sensitive Label/ Humidity Indicator Card Communication Package, Aug. 15, 2002
.pdf(09/02/2002)
CCN082401TC1 - Si wafer epitaxy transferred from Newark to San Jose, CA fab
.pdf(08/24/2001)
Recall Notification for SOT-323 (SC-70 3-Lead)
.pdf(04/25/2001)
CCN082100TC1 - Transistors, Diodes, INA's and MSA products on SOT-23 and SOT-143
.pdf(08/21/2000)
022500TC1: Customer Change Notification
.pdf(06/01/2000)
CCN#9904A-REVISION B: Customer Change Notice
.pdf(08/01/1999)
CCN:9811a - HSMS, HBAT laser marking
.pdf(11/01/1998)
CCN:9710a - HSMS, HSMP #L30, #L31
.pdf(10/10/1997)
CCN:062597dg1- AT, INA, MSA, HSMS, HSMP Mfg. location change
.pdf(06/25/1997)
CCN:22195 - Manufacturing Wafer Fab Relocation
.pdf(02/21/1995)
Reliability Data Sheet (1)
HBAT-54xx, HSMS-270x, HSMS-280x, HSMS-281x, HSMS-282x, Surface Mount Schottky Diodes Reliability Data Sheet
.pdf(08/02/2007)
Spice Model (1)
HSMS-282x_SPICE
.etc(02/26/2000)
About 关于我们
Business 商务合作
Careers 人才招聘
Sitemap 网站导航
Privacy 隐私条款
©1993 - 2024 BDTIC