HMPS-2820 射频和微波混频器 / 侦测二极管
产品技术资料及技术规格
应用笔记
- Application Brief?-?Surface Mount Schottky PIN Diode?(57 KB,PDF)
- Application Note?-?AN 1069: Non RF Applications for the Surface Mount Schottky Diode Pairs HSMS2802 HSMS2822?(310 KB,PDF)
- Application Note?-?AN 1088: Designing the Virtual Battery?(1083 KB,PDF)
- Application Note?-?AN 1124: Linear Models for Diode Surface Mount Packages?(141 KB,PDF)
- Application Note?-?AN 1156: Diode Detector Simulation EEs ADS Softward?(162 KB,PDF)
- Application Note?-?AN 1187: Design an Input Matching Network for a DC Biased 850 MHz Small Signal Detector?(144 KB,PDF)
- Application Note?-?AN1328: A Temperature Compensated Linear Power Detector?(403 KB,PDF)
- Application Note?-?AN 1328: HPMS-2825 A Temperature Compensated Linear Power Detector?(215 KB,PDF)
- Application Note?-?AN 923: Schottky Barrier Video Detectors?(190 KB,PDF)
- Application Note?-?AN 9441: Microwave Transistor Bias Considerations?(1447 KB,PDF)
- Application Note?-?AN 9561: The Criterion for the Tangential Sensitivity Measurement?(123 KB,PDF)
- Application Note?-?AN 956-3 Flicker Noise Schottky Diodes?(160 KB,PDF)
- Application Note?-?AN 956-5: Dynamic Range Extension Schottky Detectors?(112 KB,PDF)
- Application Note?-?AN 956-6: Temperature Dependence Schottky Detector Voltage Sensitivity ?(512 KB,PDF)
- Application Note?-?AN 963: Matching Techniques for Mixers Detectors?(1019 KB,PDF)
- Application Note?-?AN 986: Square Law Linear Detection?(663 KB,PDF)
- Application Note?-?AN 987: Is Bias Current Necessary?(115 KB,PDF)
- Application Note?-?AN 988: All Schottky Diodes are Zero Bias Detectors?(769 KB,PDF)
- Application Note?-?AN 997: A 2 GHz Balanced Mixer SOT23 Surface Mount Schottky Diodes?(209 KB,PDF)
- Application Note?-?AN A004R: Electrostatic Discharge mage Control?(396 KB,PDF)
- Application Note?-?AN A006: Mounting Considerations for Microwave Semiconductors?(87 KB,PDF)
产品变更通知书
- Product Changes Notice (PCN)?-?A06-003-480035-0A, Nov.2005?(26 KB,PDF)
- Product Changes Notice (PCN)?-?CCN021402AT1 - Transfer of semiconductor wafer fabrication?(17 KB,PDF)
- Product Changes Notice (PCN)?-?CCN082401TC1 - Si wafer epitaxy transferred from Newark to San Jose, CA fab?(24 KB,PDF)
- Product Changes Notice (PCN)?-?CCN082701TC1 - Si wafer substrate will change from 3" to 4"?(22 KB,PDF)
- Product Changes Notice (PCN)?-?PCN: A04-002-480035-0A, Apr. 2004?(14 KB,PDF)
- Product Changes Notice (PCN)?-?PCN: A04-013-480035-0A, Dec. 2004?(16 KB,PDF)
- Product Changes Notice (PCN)?-?V12-009-480036-0A - Change in cover tape material ?(67 KB,PDF)
- Product Changes Notice (PCN)?-?V13-004-480035-0A - Change of platform and Alternative second source for testing Quad Flat?(328 KB,PDF)
质量和可靠性