SN74ABT18652 具有 18 位总线收发器和寄存器的扫描测试设备
This scan test device with an 18-bit bus transceiver and register is a member of the Texas Instruments SCOPE™ testability IC family. This device supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the four-wire test access port (TAP) interface.
In the normal mode, this device is an 18-bit bus transceiver and register that allows for multiplexed transmission of data directly from the input bus or from the internal registers. It can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self-test on the boundary test cells
| SN74ABT18652 | |
| Voltage Nodes(V) | 5 |
| Vcc range(V) | 4.5 to 5.5 |
| Input Level | TTL |
| Logic | True |
| No. of Outputs | 18 |
| Output Drive(mA) | -32/64 |
| tpd max(ns) | 6.1 |
| Output Level | TTL |
| Static Current | 18.5 |
| Rating | Catalog |
| Technology Family | ABT |
SN74ABT18652 特性
- Member of the Texas Instruments Widebus™ Family
- Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
- Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data
- Two Boundary-Scan Cells Per I/O for Greater Flexibility
- SCOPE™ Instruction Set
- IEEE Std 1149.1-1990 Required Instructions, Optional INTEST, and P1149.1A CLAMP and HIGHZ
- Parallel Signature Analysis at Inputs With Masking Option
- Pseudorandom Pattern Generation From Outputs
- Sample Inputs/Toggle Outputs
- Binary Count From Outputs
- Device Identification
- Even-Parity Opcodes
SN74ABT18652 芯片订购指南
| 器件 | 状态 | 温度 | 价格（美元） | 封装 | 引脚 | 封装数量 | 封装载体 | 丝印标记 |
| SN74ABT18652PM | ACTIVE | -40 to 85 | 14.40 | 1ku | LQFP (PM) | 64 | 160 | JEDEC TRAY (10+1) | |
| SN74ABT18652PMG4 | ACTIVE | -40 to 85 | 14.40 | 1ku | LQFP (PM) | 64 | 160 | JEDEC TRAY (10+1) |
SN74ABT18652 质量与无铅数据
| 器件 | 环保计划* | 铅/焊球涂层 | MSL 等级/回流焊峰 | 环保信息与无铅 (Pb-free) | DPPM / MTBF / FIT 率 |
| SN74ABT18652PM | Green (RoHS & no Sb/Br) | CU NIPDAU | Level-3-260C-168 HR | SN74ABT18652PM | SN74ABT18652PM |
| SN74ABT18652PMG4 | Green (RoHS & no Sb/Br) | CU NIPDAU | Level-3-260C-168 HR | SN74ABT18652PMG4 | SN74ABT18652PMG4 |
SN74ABT18652 应用技术支持与电子电路设计开发资源下载
- SN74ABT18652 数据资料 dataSheet 下载.PDF
- TI 德州仪器特殊逻辑产品选型与价格 . xls
- Shelf-Life Evaluation of Lead-Free Component Finishes (PDF 1305 KB)
- Understanding and Interpreting Standard-Logic Data Sheets (PDF 857 KB)
- TI IBIS File Creation, Validation, and Distribution Processes (PDF 380 KB)
- Implications of Slow or Floating CMOS Inputs (PDF 101 KB)
- CMOS Power Consumption and CPD Calculation (PDF 89 KB)
- Designing With Logic (PDF 186 KB)
- Live Insertion (PDF 150 KB)
- Input and Output Characteristics of Digital Integrated Circuits (PDF 1708 KB)
- Using High Speed CMOS and Advanced CMOS in Systems With Multiple Vcc (PDF 43 KB)
- HiRel Unitrode Power Management Brochure (PDF 206 KB)
- LOGIC Pocket Data Book (PDF 6001 KB)
- HiRel Unitrode Power Management Brochure (PDF 206 KB)
- Logic Cross-Reference (PDF 2938 KB)
