SN74LVTH18646A-EP 具有 18 位通用总线收发器的 3.3V ABT 扫描测试设备
The SN74LVTH18646A and SN74LVTH182646A scan test devices, with 18-bit bus transceivers and registers, are members of the Texas Instruments (TI) SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
Additionally, these devices are designed specifically for low-voltage (3.3-V) VCC operation, but with the capability to provide a TTL interface to a 5-V system environment.
In the normal mode, these devices are 18-bit bus transceivers and registers that allow for multiplexed transmission of data directly from the input bus or from the internal registers.
| SN74LVTH18646A-EP | |
| Voltage Nodes(V) | 3.3, 2.7 |
| Vcc range(V) | 2.7 to 3.6 |
| Input Level | TTL/CMOS |
| Logic | True |
| No. of Outputs | 18 |
| Output Drive(mA) | -32/64 |
| tpd max(ns) | 4.7 |
| Output Level | LVTTL |
| Static Current | 24 |
| Rating | HiRel Enhanced Product |
| Technology Family | LVT |
SN74LVTH18646A-EP 特性
- Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
- Enhanced Diminishing Manufacturing Sources (DMS) Support
- Enhanced Product-Change Notification
- Qualification Pedigree
- Members of the Texas Instruments SCOPE™ Family of Testability Products
- Members of the Texas Instruments Widebus™ Family
- State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC)
- Support Unregulated Battery Operation Down to 2.7 V
- Include D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data
- Bus Hold on Data Inputs Eliminates the Need for External Pullup/Pulldown Resistors
- B-Port Outputs of SN74LVTH182646A Devices Have Equivalent 25-
Series Resistors, So No External Resistors Are Required
- Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
- SCOPE™ Instruction Set
- IEEE Std 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ
- Parallel-Signature Analysis at Inputs
- Pseudorandom Pattern Generation From Outputs
- Sample Inputs/Toggle Outputs
- Binary Count From Outputs
- Device Identification
SN74LVTH18646A-EP 芯片订购指南
| 器件 | 状态 | 温度 | 价格（美元） | 封装 | 引脚 | 封装数量 | 封装载体 | 丝印标记 |
| 8V18646AIPMREP | ACTIVE | -40 to 85 | 25.71 | 1ku | LQFP (PM) | 64 | 160 | JEDEC TRAY (10+1) | |
| V62/04731-01XE | ACTIVE | -40 to 85 | 25.71 | 1ku | LQFP (PM) | 64 | 160 | JEDEC TRAY (10+1) |
SN74LVTH18646A-EP 质量与无铅数据
| 器件 | 环保计划* | 铅/焊球涂层 | MSL 等级/回流焊峰 | 环保信息与无铅 (Pb-free) | DPPM / MTBF / FIT 率 |
| 8V18646AIPMREP | TBD | CU NIPDAU | Level-3-260C-168 HR | 8V18646AIPMREP | 8V18646AIPMREP |
| V62/04731-01XE | TBD | CU NIPDAU | Level-3-260C-168 HR | V62/04731-01XE | V62/04731-01XE |
SN74LVTH18646A-EP 应用技术支持与电子电路设计开发资源下载
- SN74LVTH18646A-EP 数据资料 dataSheet 下载.PDF
- TI 德州仪器特殊逻辑产品选型与价格 . xls
- Shelf-Life Evaluation of Lead-Free Component Finishes (PDF 1305 KB)
- Understanding and Interpreting Standard-Logic Data Sheets (PDF 857 KB)
- TI IBIS File Creation, Validation, and Distribution Processes (PDF 380 KB)
- Implications of Slow or Floating CMOS Inputs (PDF 101 KB)
- CMOS Power Consumption and CPD Calculation (PDF 89 KB)
- Designing With Logic (PDF 186 KB)
- Live Insertion (PDF 150 KB)
- Input and Output Characteristics of Digital Integrated Circuits (PDF 1708 KB)
- Using High Speed CMOS and Advanced CMOS in Systems With Multiple Vcc (PDF 43 KB)
- HiRel Unitrode Power Management Brochure (PDF 206 KB)
- LOGIC Pocket Data Book (PDF 6001 KB)
- HiRel Unitrode Power Management Brochure (PDF 206 KB)
- Logic Cross-Reference (PDF 2938 KB)
