SN54BCT8373A 具有八路 D 类锁存器的扫描测试设备
The 'BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPETM testability integrated-
circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
In the normal mode, these devices are functionally equivalent to the 'F373 and 'BCT373 octal D-type latches. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal latches
|
SN54BCT8373A |
| Voltage Nodes(V) |
5 |
| Vcc range(V) |
4.5 to 5.5 |
| Input Level |
TTL |
| Logic |
True |
| No. of Outputs |
8 |
| Output Drive(mA) |
-15/64 |
| tpd max(ns) |
9.5 |
| Output Level |
TTL |
| Static Current |
29.75 |
| Rating |
Military |
| Technology Family |
BCT |
SN54BCT8373A 特性
- Members of the Texas Instruments SCOPETM Family of Testability Products
- Octal Test-Integrated Circuits
- Functionally Equivalent to 'F373 and 'BCT373 in the Normal-Function Mode
- Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
- Test Operation Synchronous to Test Access Port (TAP)
- Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage (10 V) on TMS Pin
- SCOPETM Instruction Set
- IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ
- Parallel Signature Analysis at Inputs
- Pseudo-Random Pattern Generation From Outputs
- Sample Inputs/Toggle Outputs
- Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic and Ceramic 300-mil DIPs (JT, NT)
SN54BCT8373A 芯片订购指南
| 器件 |
状态 |
温度 |
价格（美元） |
封装 | 引脚 |
封装数量 | 封装载体 |
丝印标记 |
| 5962-9172501M3A |
ACTIVE |
-55 to 125 |
36.37 | 1ku |
LCCC (FK) | 28 |
1 | TUBE |
|
| 5962-9172501MLA |
ACTIVE |
-55 to 125 |
23.36 | 1ku |
CDIP (JT) | 24 |
1 | TUBE |
|
| SNJ54BCT8373AFK |
ACTIVE |
-55 to 125 |
36.37 | 1ku |
LCCC (FK) | 28 |
1 | TUBE |
|
| SNJ54BCT8373AJT |
ACTIVE |
-55 to 125 |
23.36 | 1ku |
CDIP (JT) | 24 |
1 | TUBE |
|
SN54BCT8373A 质量与无铅数据
| 器件 |
环保计划* |
铅/焊球涂层 |
MSL 等级/回流焊峰 |
环保信息与无铅 (Pb-free) |
DPPM / MTBF / FIT 率 |
| 5962-9172501M3A |
TBD |
POST-PLATE |
N/A for Pkg Type |
5962-9172501M3A |
5962-9172501M3A |
| 5962-9172501MLA |
TBD |
A42 |
N/A for Pkg Type |
5962-9172501MLA |
5962-9172501MLA |
| SNJ54BCT8373AFK |
TBD |
POST-PLATE |
N/A for Pkg Type |
SNJ54BCT8373AFK |
SNJ54BCT8373AFK |
| SNJ54BCT8373AJT |
TBD |
A42 |
N/A for Pkg Type |
SNJ54BCT8373AJT |
SNJ54BCT8373AJT |
SN54BCT8373A 应用技术支持与电子电路设计开发资源下载
- SN54BCT8373A 数据资料 dataSheet 下载.PDF
- TI 德州仪器特殊逻辑产品选型与价格 . xls
- Shelf-Life Evaluation of Lead-Free Component Finishes (PDF 1305 KB)
- Understanding and Interpreting Standard-Logic Data Sheets (PDF 857 KB)
- TI IBIS File Creation, Validation, and Distribution Processes (PDF 380 KB)
- Implications of Slow or Floating CMOS Inputs (PDF 101 KB)
- CMOS Power Consumption and CPD Calculation (PDF 89 KB)
- Designing With Logic (PDF 186 KB)
- Live Insertion (PDF 150 KB)
- Input and Output Characteristics of Digital Integrated Circuits (PDF 1708 KB)
- Using High Speed CMOS and Advanced CMOS in Systems With Multiple Vcc (PDF 43 KB)
- HiRel Unitrode Power Management Brochure (PDF 206 KB)
- LOGIC Pocket Data Book (PDF 6001 KB)
- HiRel Unitrode Power Management Brochure (PDF 206 KB)
- Logic Cross-Reference (PDF 2938 KB)
